WARDHANI, Diah; 						MAULITA, Yani; 						SYAHPUTRA, Siswan.
 Expert System to Diagnose Stem Border in Sugarcane Plant with Certainty Factor Method.
<strong>International Journal of Informatics, Economics, Management and Science</strong>, [S.l.], v. 3, n. 1, p. 58-68, jan. 2024.
ISSN 2809-8471.
Available at: &lt;<a href="https://www.journal.stmikjayakarta.ac.id/index.php/ijiems/article/view/1226" target="_new">https://www.journal.stmikjayakarta.ac.id/index.php/ijiems/article/view/1226</a>&gt;. Date accessed: 07 july 2025.
doi: <a href="https://doi.org/10.52362/ijiems.v3i1.1226">https://doi.org/10.52362/ijiems.v3i1.1226</a>.